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Fischione

放大字体  缩小字体 2021-09-09
  • 品牌名称:Fischione
  • 公司名称:BIOMETER
  • 官方主页:暂无
  • 所在地区:进口
品牌介绍

确保以客户为中心,同时为显微镜界提供最高质量、最具创新性的仪器。Fischione 将继续满足现有需求,并满足新兴显微镜和纳米技术应用的要求。

历史

1966年

Eugene A. Fischione 于 1966 年创立了 EA Fischione Instruments, Inc.。1956 年至 1977 年期间,作为美国钢铁技术中心(前身为美国钢铁研究中心)的研究机械师,Eugene Fischione 参与了电子显微镜的许多早期发展。他的贡献主要集中在开发和制造实验仪器领域。

随着技术的进步,开发用于在电子显微镜 (EM) 中进行观察和分析的样品的产品的需求增加。Eugene Fischione 与领先的材料科学家合作开发了自动双喷射电解抛光机。该设备从薄箔制备可接受的样品,可在透射电子显微镜中进行直接观察。(1) 该仪器仍在销售中,可在 40 多个国家/地区的实验室中找到。

1978-1994

1978 年以机械工程师身份从匹兹堡大学毕业后,创始人之子 Paul E. Fischione 在矿山安全设备公司 (MSA) 和联合技术公司 (UTC) 的研究和工程部门获得了经验。1986 年收购公司所有权后,Paul Fischione 确立了其未来发展方向并启动了新产品开发,包括:

  • 电解抛光机配套产品
  • 样品制备仪器,以满足电子显微镜不断变化的焦点,用于透射电子显微镜 (TEM) 的先进材料研究样品(即陶瓷、半导体、高 Tc 超导体和金属基复合材料)的研究
  • 用于将样品展示给电子光学器件的专用样品架技术
  • 超高分辨率成像探测器

Fischione Instruments 产品线已扩展到包括制备 TEM 样品所需的所有主要设备:

  • 170型超声刀盘
  • 型号200的凹痕磨床
  • 1010 型离子研磨机(2010 年被 1050 型 TEM 研磨机取代,然后在 2016 年被1051 型 TEM 研磨机取代)

1995 年至今

1995 年,随着1020 型等离子清洗机的推出,开创了试样制备的新时代。1020 型使用低能气体等离子体去除 TEM 样品中的有机污染物。在使用最先进的 TEM 进行电子显微镜检查时,1020 型的专利技术至关重要。1020 型的推出标志着 Fischione Instruments 首次将一项技术推向市场,大大提升了其作为先进 TEM 相关仪器主要供应商的声誉。

3000 型环形暗场探测器于 1998 年推出,可提供高分辨率扫描/透射电子显微镜 (STEM) 成像。看到显微镜从二维信息到三维信息的转变,Fischione Instruments 在 2002 年推出了2020 型高级断层扫描支架。2020 型允许在较宽的倾斜和平移范围内收集室温数据,即使在具有限制性极片间隙几何形状的 TEM 中也是如此。断层扫描支架产品线随后扩展到包括2030 型超窄间隙断层扫描支架(2005 年)、2040 型双轴断层扫描支架(2006 年)和2050 型同轴旋转断层扫描支架(2006 年)。

由于 Fischione Instrument 的业务是为 TEM 样品制备的高级形式提供工具,因此它认识到许多 TEM 制备技术已适用于 SEM 样品。因此,Fischione Instruments 在 2003 年推出了 1030 型自动样品制备 (ASaP) 系统。1030 ASaP 型结合了等离子清洗、离子束蚀刻、反应离子蚀刻和高分辨率离子束溅射镀膜的特点。

为了保持其在先进样品制备技术方面的创新传统,并考虑到越来越多地使用聚焦离子束 (FIB) 系统从散装材料中的特定位置制备样品,Fischione 开发了技术以提高常规和FIB 制备的标本。由此产生了1040 型 NanoMill® TEM 样品制备系统,该系统于 2004 年推出。NanoMill 系统具有低至 50 eV 的离子能量和小至 1 µm 的光束尺寸。

为了将样品制备更上一层楼,Fischione Instruments 在 2010 年推出了三款主要新产品。 1050 型 TEM 研磨机(自2016 年被1051 型 TEM 研磨机取代)是一种传统的离子研磨系统,用于创建薄的、电子透明的TEM 成像和分析所需的样品。将 TEM 离子束研磨技术应用于扫描电子显微镜 (SEM) 样品产生了 1060 型 SEM 研磨机,该研磨机于 2016年更新为1061 型 SEM 研磨机。利用 TEM 研磨机中包含的大部分产品技术,SEM 研磨机提供广泛的应用,包括半导体、用于电子背散射检测 (EBSD) 的增强表面,以及快速扩展的地质样品大规模成像领域。

以 1020 型等离子清洁器的杰出传统为基础,推出了1070 型 NanoClean。1070 型使用等离子技术自动快速去除电子显微镜标本、标本架和存根中的有机污染物(碳氢化合物)。

2014 年被证明是 Fischione Instruments 重要的一年。推出了两种新的离子铣削仪器:1080 型 PicoMill® TEM 样品制备系统1063 型 WaferMill™ 离子束延迟解决方案

PicoMill 系统建立在 Model 1040 NanoMill 系统的成功基础之上。除了提供不含非晶层和注入层的最终样品质量外,PicoMill 系统还包括通过添加扫描电子柱以及背散射电子检测器 (BSE)、二次电子检测器 (SED) 进行的原位成像和 STEM 探测器。STEM 功能尤其值得注意,因为该功能使 PicoMill 系统能够执行端点检测。

用于 CD-SEM 样品制备的 WaferMill 解决方案在完整的 300 毫米晶圆上提供选定区域铣削,这允许从上到下延迟完整晶圆上的多个预选区域。整个过程是自动化的;无需手动触摸晶圆。

PicoMill 系统和 WaferMill 解决方案的加入标志着 Fischione 在为半导体细分市场开发产品方面的重大投资。

当年推出的其他产品包括 2040 型双轴断层扫描支架的电动版本 - 2045 型电动双轴断层扫描支架。此外,Fischione 推出了2560 型真空转移断层扫描支架,该支架适用于可因环境条件而改变的敏感标本;样品可以在真空或惰性气体环境中转移。

Fischione 还通过推出2550 型低温转移断层扫描支架,表明了其对生命科学市场领域的承诺,该支架非常适合需要液氮冷却以转移到 TEM 进行成像和分析的标本。

如今,Fischione Instruments 的产品已在全球 500 多个研究实验室中找到。最终用户是在大学、半导体制造商、核和医疗材料研究公司、钢铁、汽车、航空航天和通信公司以及美国国防部和几个国家的分支机构工作的显微镜学家、材料科学家、冶金学家和生命科学家。实验室。产品在美国直接销售,并通过国外分销网络销售。


To ensure a customer focus, while providing the highest quality, most innovative instrumentation to the microscopy community. Fischione will continue to serve existing needs, as well as address the requirements of emerging microscopy and nanotechnology applications.

History

1966

Eugene A. Fischione founded E.A. Fischione Instruments, Inc. in 1966. As a research machinist at the U.S. Steel Technical Center (formerly U.S. Steel Research Center) from 1956 to 1977, Eugene Fischione was involved with many of the early developments in electron microscopy. His contributions were concentrated in the area of developing and fabricating experimental instrumentation.

As technology advanced, the need increased to develop products that prepare the specimen for observation and analysis in the electron microscope (EM). Working with leading materials scientists, Eugene Fischione developed the Automatic Twin-Jet Electropolisher. From a thin foil, this device prepares a specimen acceptable for direct observation in a transmission electron microscope.(1) This instrument is still being sold and can be found in laboratories in more than 40 countries.

1978-1994

After graduation as a mechanical engineer from the University of Pittsburgh in 1978, Paul E. Fischione, son of the founder, gained experience in the research and engineering departments at Mine Safety Appliances Company (MSA) and United Technologies Corporation (UTC). After acquiring ownership of the company in 1986, Paul Fischione established its future direction and initiated new product developments, including:

  • Electropolisher ancillary products
  • Specimen preparation instruments to meet the changing focus of electron microscopy for the study of advanced materials research specimens (i.e., ceramics, semiconductors, high-Tc superconductors, and metal matrix composites) for transmission electron microscopy (TEM)
  • Specialized specimen holder technology for the presentation of the specimen to the electron optics
  • Ultra-high resolution imaging detector

The Fischione Instruments product line was expanded to include all of the major devices that are required for preparing TEM specimens:

  • The Model 170 Ultrasonic Disk Cutter
  • The Model 200 Dimpling Grinder
  • The Model 1010 Ion Mill (replaced by the Model 1050 TEM Mill in 2010 and then the Model 1051 TEM Mill in 2016)

1995-Present

In 1995, a new era of specimen preparation was created with the introduction of the Model 1020 Plasma Cleaner. The Model 1020 uses a low-energy gas plasma to remove organic contamination from TEM specimens. The patented technology of the Model 1020 is critical when conducting electron microscopy using state-of-the-art TEMs. The introduction of the Model 1020 marked the first time that Fischione Instruments initiated a technology into the marketplace, greatly enhancing its reputation as a premier supplier of advanced TEM related instrumentation.

Introduced in 1998, the Model 3000 Annular Dark Field Detector provides high-resolution scanning/transmission electron microscopy (STEM) imaging. Seeing the move in microscopy from two-dimensional to three-dimensional information, in 2002 Fischione Instruments introduced the Model 2020 Advanced Tomography Holder. The Model 2020 allows room temperature data collection over wide tilt and translation ranges, even in TEMs with restrictive pole piece gap geometries. The tomography holder product line has been subsequently expanded to include the Model 2030 Ultra-Narrow Gap Tomography Holder(2005), the Model 2040 Dual-Axis Tomography Holder (2006), and the Model 2050 On-Axis Rotation Tomography Holder (2006).

Because Fischione Instrument’s business is to provide tools for advanced forms of specimen preparation for TEM, it recognized that many TEM preparation techniques have become applicable to SEM samples. As a result, in 2003 Fischione Instruments introduced the Model 1030 Automated Sample Prep (ASaP) System. The Model 1030 ASaP combines the features of plasma cleaning, ion beam etching, reactive ion etching, and high-resolution ion beam sputter coating.

In keeping with its tradition of innovation in advanced specimen preparation technology, and considering the increased usage of focused ion beam (FIB) systems for the preparation of specimens from specific sites within the bulk material, Fischione developed technology to enhance the quality of both conventional and FIB-prepared specimens. This yielded the Model 1040 NanoMill® TEM specimen preparation system, which was introduced in 2004. The NanoMill system features ion energies as low as 50 eV and a beam size as small as 1 µm.

To take specimen preparation to the next level, Fischione Instruments launched three major new products in 2010. The Model 1050 TEM Mill (since replaced by the Model 1051 TEM Mill in 2016) was a conventional ion milling system used for creating the thin, electron transparent specimens needed for TEM imaging and analysis. Applying TEM ion beam milling technology to scanning electron microscopy (SEM) samples yielded the Model 1060 SEM Mill, which was updated to the Model 1061 SEM Mill in 2016. Leveraging much of the product technology contained in the TEM Mill, the SEM Mill serves a broad range of applications including semiconductors, enhancing surfaces for electron backscatter detection (EBSD), as well as the rapidly expanding field of large-scale imaging of geological samples.

Building upon the outstanding tradition of the Model 1020 Plasma Cleaner, the Model 1070 NanoClean was introduced.  The Model 1070 uses plasma technology to automatically and quickly remove organic contamination (hydrocarbon) from electron microscopy specimens, specimen holders, and stubs.

The year 2014 proved to be an important year for Fischione Instruments. Two new ion milling instruments were introduced: the Model 1080 PicoMill® TEM specimen preparation system and the Model 1063 WaferMill™ ion beam delayering solution.

The PicoMill system builds upon the success of the Model 1040 NanoMill system. In addition to providing ultimate specimen quality that is free from amorphous and implanted layers, the PicoMill system includes in situ imaging through the addition of a scanning electron column, as well as a backscatter electron detector (BSE), a secondary electron detector (SED) and a STEM detector. The STEM capability is especially notable because that feature enables the PicoMill system to perform endpoint detection.

The WaferMill solution for CD-SEM sample preparation provides selected-area milling on full 300 mm wafers, which allows the delayering of multiple pre-selected regions on a full wafer from the top down. The entire process is automated; there is no need to manually touch a wafer.

The addition of the PicoMill system and the WaferMill solution mark Fischione's significant investment in developing products for the semiconductor market segment.

Other products introduced that year includes a motorized version of the Model 2040 Dual-Axis Tomography Holder — the Model 2045 Motorized Dual-Axis Tomography Holder. In addition, Fischione introduced the Model 2560 Vacuum Transfer Tomography Holder, which is intended for sensitive specimens that can be altered by environmental conditions; the specimen can be transferred in the presence of vacuum or an inert gas environment.

Fischione also signaled its commitment to the life sciences market segment with the introduction of the Model 2550 Cryo Transfer Tomography Holder, which is ideal for specimens that require liquid-nitrogen cooling for transfer to the TEM for imaging and analysis.

Today, Fischione Instruments’ products are found in more than 500 research laboratories worldwide. End users are microscopists, materials scientists, metallurgists, and life scientists working at universities, semiconductor manufacturers, nuclear and medical materials research firms, steel, automotive, aerospace and communications companies, as well as branches of the United States Department of Defense and several national laboratories. Products are sold direct in the U.S. and through a foreign distribution network.


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